Far-infraredc-axis response ofLa1.87Sr0.13CuO4determined by ellipsometry

Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

Dielectric anisotropy and phonon modes of ordered indirect-gap Al0.52In0.48P studied by far-infrared ellipsometry

SOFT-MODE PHONONS in SrTiO3 THIN FILMS STUDIED by FAR-INFRARED ELLIPSOMETRY and RAMAN SCATTERING

We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm and electric field-induced Raman scattering techniques have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of ...

Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magnetooptic ellipsometry

"Conduction-band electron effective mass in Zn 0.87 Mn 0.13 Se measured by terahertz and far-infrared magnetooptic ellipsometry" (2006). Faculty Publications from Nebraska Center for Materials and Nanoscience. 11.

Far - infrared c - axis conductivity of flux - grown Y 1 − x Pr x Ba 2 Cu 3 O 7 single crystals studied by spectral ellipsometry